Characterization of standard reference materials for obtaining instrumental line profiles

Powder Diffraction

Volumn 13, Issue 2, 1998, Pages 210-215

  Leoni, Matteo ^a   Scardi, Paolo ^a   Langford, J Ian ^b  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Line profile analysis; Sample transparency; Standard reference materials (SRMs); Synchrotron radiation

Indexed keywords

SYNCHROTRON RADIATION; TRANSPARENCY; SYNCHROTRONS;

DIVERGENT BEAMS; GEOMETRICAL EFFECT; LINE PROFILE ANALYSIS; PARALLEL BEAMS; POWDER DIFFRACTION; STANDARD REFERENCE MATERIAL; STANDARD REFERENCE MATERIALS (SRMS); STRUCTURAL IMPERFECTIONS;

SYNCHROTRONS; CHARACTERIZATION;

EID: 0032262294     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/s0885715600010125     Document Type: Article

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