Modelling Dislocation-Induced Anisotropic Line Broadening in Rietveld Refinements Using a Voigt Function. I. General Principles

Journal of Applied Crystallography

Volumn 31, Issue 3, 1998, Pages 356-362

  Wu, E ^a,c   Gray, E Mac A ^a   Kisi, E H ^b  

^a GRIFFITH UNIVERSITY   (Australia)

^b UNIVERSITY OF NEWCASTLE   (Australia)

^c UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000182838     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188989701217X     Document Type: Article

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