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IEEE Symposium on VLSI Circuits, Digest of Technical Papers
Volumn , Issue , 2002, Pages 2-5
MOSFET scalability limits and "new frontier" devices
(1)
Antoniadis, Dimitri A
a
a
Department of Civil and Environmental Engineering
(
United States
)
Author keywords
[No Author keywords available]
Indexed keywords
CARBON NANOTUBES; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; ELECTROSTATICS; FIELD EFFECT TRANSISTORS; TRANSCONDUCTANCE;
ELECTROSTATIC CONTROL;
MOSFET DEVICES;
EID
:
0036051390
PISSN
:
None
EISSN
:
None
Source Type
:
Conference Proceeding
DOI
:
None
Document Type
:
Conference Paper
Times cited : (
38
)
References (
34
)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.
