SCOPUS 정보 검색 플랫폼

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 3, 2002, Pages 1259-1265

Vertical ordering in multilayers of self-assembled Ge/Si(001) quantum dots

(7) Le Thanh, Vinh a Yam, V a Nguyen, Lam H a Zheng, Y b Boucaud, P a Debarre D a Bouchier, D a

a UNIVERSITÉ PARIS SACLAY (France)

b UNIVERSITÉ PIERRE ET MARIE CURIE (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELASTICITY; NUCLEATION; PHOTOLUMINESCENCE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SELF ASSEMBLY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPIC ANALYSIS; STRAIN; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM; WETTING;

VERTICAL ORDERING;

MULTILAYERS;

EID: 0035998576 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1456522 Document Type: Conference Paper

Times cited : (14)

References (34)

1
- 3643130905
- (1990) Phys. Rev. Lett. , vol.64 , pp. 1943
- Eaglesham, D.J.¹ Cerullo, M.²

2
- 3343007423
- (1994) Phys. Rev. Lett. , vol.72 , pp. 3570
- Tersoff, J.¹ LeGoues, F.K.²

3
- 0030288275
- (1998) Semicond. Sci. Technol. , vol.11 , pp. 1521
- Abstreiter, G.¹ Schittenhelm, P.² Engel, C.³ Silveria, E.⁴ Zrenner, A.⁵ Meertens, D.⁶ Jäger, W.⁷

4
- 7244257542
- (1996) Phys. Rev. Lett. , vol.76 , pp. 1675
- Tersoff, J.¹ Teichert, C.² Lagally, M.G.³

5
- 2842567225
- (1996) Phys. Rev. B , vol.53 , pp. 16334
- Teichert, C.¹ Lagally, M.G.² Peticolas, L.J.³ Bean, J.C.⁴ Tersoff, J.⁵

6
- 0005834097
- (1995) Phys. Rev. Lett. , vol.75 , pp. 2542
- Xie, Q.¹ Madhukar, A.² Chen, P.³ Kobayashi, N.P.⁴

7
- 4243585170
- (1998) Phys. Rev. B , vol.58 , pp. 13115
- Le Thanh, V.¹ Boucaud, P.² Débarre, D.³ Zheng, Y.⁴ Bouchier, D.⁵ Lourtioz, J.-M.⁶

8
- 0001414142
- (1999) J. Cryst. Growth , vol.201-202 , pp. 1212
- Le Thanh, V.¹ Boucaud, P.² Zheng, Y.³ Younsi, A.⁴ Débarre, D.⁵ Bouchier, D.⁶ Lourtioz, J.-M.⁷

9
- 0005580628
- (1996) Phys. Rev. Lett. , vol.76 , pp. 952
- Solomon, G.S.¹ Trezza, J.A.² Marshall, A.F.³ Harris J.S., Jr.⁴

10
- 0001389966
- (1997) Appl. Phys. Lett. , vol.71 , pp. 2972
- Zundel, M.K.¹ Specht, P.² Eberl, K.³ Jin-Philipp, N.Y.⁴ Philipp, F.⁵

11
- 0031140982
- (1997) J. Cryst. Growth , vol.175-176 , pp. 713
- Nakata, Y.¹ Sugiyama, Y.² Futatsugi, T.³ Yokoyama, N.⁴

12
- 0001495376
- (1999) Appl. Phys. Lett. , vol.74 , pp. 269
- Kienzle, O.¹ Ernst, F.² Rühle, M.³ Schmidt, O.G.⁴ Eberl, K.⁵

13
- 0001207460
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1272
- Schmidt, O.G.¹ Kienzle, O.² Hao, Y.³ Eberl, K.⁴ Ernst, F.⁵

14
- 0000082066
- (2000) Phys. Rev. B , vol.61 , pp. 13721
- Schmidt, O.G.¹ Eberl, K.²

15
- 0034670731
- (2000) Phys. Rev. B , vol.62 , pp. 16715
- Schmidt, O.G.¹ Eberl, K.² Rau, Y.³

16
- 0000577886
- (1997) Appl. Phys. Lett. , vol.71 , pp. 3233
- Mateeva, E.¹ Sutter, P.² Bean, J.C.³ Lagally, M.G.⁴

17
- 0030166498
- (1996) Appl. Phys. A: Mater. Sci. Process. , vol.62 , pp. 575
- Rahmati, B.¹ Jäger, W.² Trinkaus, H.³ Loo, R.⁴ Vescan, L.⁵ Lüth, H.⁶

18
- 0034143162
- (2000) Philos. Mag. A , vol.80 , pp. 255
- Tillmann, K.¹ Jäger, W.² Rahmati, B.³ Trinkaus, H.⁴ Vescan, L.⁵ Urban, K.⁶

19
- 0032137858
- (1998) J. Cryst. Growth , vol.191 , pp. 697
- Dentel, D.¹ Bischoff, J.L.² Kubler, L.³ Werckmann, J.⁴ Romeo, M.⁵

20
- 0343143295
- (1998) J. Vac. Sci. Technol. B , vol.16 , pp. 1575
- Schittenhelm, P.¹ Engel, C.² Findeis, F.³ Abstreiter, G.⁴ Darhuber, A.⁵ Bauer, G.⁶ Kosogov, A.O.⁷ Werner, P.⁸

21
- 3342990103
- (1999) Phys. Rev. B , vol.60 , pp. 5851
- Le Thanh, V.¹ Yam, V.² Boucaud, P.³ Fortuna, F.⁴ Ulysse, C.⁵ Bouchier, D.⁶ Vervoort, L.⁷ Lourtioz, J.-M.⁸

22
- 0034227219
- (2000) Thin Solid Films , vol.369 , pp. 43
- Le Thanh, V.¹ Yam, V.² Boucaud, P.³ Zheng, Y.⁴ Bouchier, D.⁵

23
- 0032614165
- (1999) Phys. Rev. Lett. , vol.83 , pp. 356
- Holy, V.¹ Springholz, G.² Pinczolits, M.³ Bauer, G.⁴

24
- 0001270904
- (1998) Phys. Rev. B , vol.57 , pp. 12262
- Shchukin, V.A.¹ Bimberg, D.² Malyshkin, V.G.³ Ledentsov, N.N.⁴

25
- 0032614426
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1089
- Zhang, Y.W.¹ Xu, S.J.² Chiu, C.-H.³

26
- 0034909698
- (2001) Phys. Rev. B , vol.63 , pp. 153303
- Priester, C.¹

27
- 0035922858
- (2001) Surf. Sci. , vol.492 , pp. 255
- Le Thanh, V.¹

28
- 0001981893
- edited by D. Glocker, S. I. Shah, and L. Vescan (IOP, Bristol)
- (2000) Handbook of Thin Film Process Technology
- Le Thanh, V.¹

29
- 0346715727
- (2000) J. Appl. Phys. , vol.87 , pp. 3700
- Le Thanh, V.¹ Bouchier, D.² Hincelin, G.³

30
- 0029309042
- (1995) Appl. Phys. Lett. , vol.66 , pp. 3024
- Sunamura, H.¹ Usami, N.² Shiraki, Y.³ Fukatsu, S.⁴

31
- 0029358642
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1292
- Schittenhelm, P.¹ Gail, M.² Brunner, J.³ Nützel, J.F.⁴ Abstreiter, G.⁵

32
- 3643143147
- (1990) Phys. Rev. Lett. , vol.65 , pp. 1020
- Mo, Y.-W.¹ Savage, D.E.² Swartzentruber, B.S.³ Lagally, M.G.⁴

33
- 0032535998
- (1998) Science , vol.279 , pp. 353
- Medeiros-Ribeiro, G.¹ Bratkovski, A.M.² Kamin, T.I.³ Ohlberg, D.A.A.⁴ Williams, R.S.⁵

34
- 4344708593
- (1998) Phys. Rev. Lett. , vol.80 , pp. 984
- Ross, F.M.¹ Tersoff, J.² Tromp, R.M.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.