Self-assembled Ge dots: Growth, characterization, ordering, and applications

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 3, 1998, Pages 1575-1581

  Schittenhelm, P ^a,d   Engel, C ^a   Findeis, F ^a   Abstreiter, G ^a   Darhuber, A A ^b   Bauer, G ^b   Kosogov, A O ^c   Werner, P ^c  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^d KVG Quartz Crystal Technology GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343143295     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589942     Document Type: Article

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