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Volumn 178, Issue 1-4, 2001, Pages 44-54

Ion beam synthesis of buried SiC layers in silicon: Basic physical processes

Author keywords

Amorphization; Displacive precipitate dissolution; Ion beam synthesis; Nucleation; Precipitation; Silicon carbide

Indexed keywords

AMORPHIZATION; ANNEALING; CRYSTAL GROWTH; CRYSTAL LATTICES; EPITAXIAL GROWTH; INCLUSIONS; ION BEAMS; ION BOMBARDMENT; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; NUCLEATION; PRECIPITATION (CHEMICAL); SEMICONDUCTING SILICON; SILICON CARBIDE; STOICHIOMETRY; SYNTHESIS (CHEMICAL);

EID: 0035338313     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00504-3     Document Type: Conference Paper
Times cited : (45)

References (47)
  • 30
    • 0004966454 scopus 로고    scopus 로고
    • Diploma Thesis, University of Regensburg
    • (1999)
    • Schmidt, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.