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Volumn 120, Issue 1-4, 1996, Pages 133-138

Ion beam induced amorphization and recrystallization of Si/SiC/Si layer systems

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTALLIZATION; EPITAXIAL GROWTH; ION BEAMS; ION BOMBARDMENT; SILICON CARBIDE; SILICON COMPOUNDS;

EID: 0030566569     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00495-8     Document Type: Article
Times cited : (17)

References (10)
  • 5
    • 30244548695 scopus 로고
    • Proc. 6th Int. Conf. on Silicon Carbide and Related Materials, Kyoto, Japan, IOP, Bristol
    • V. Heera, R. Kögler, W. Skorupa and J. Stoemenos, in: Proc. 6th Int. Conf. on Silicon Carbide and Related Materials, Kyoto, Japan, (1995), Inst. Phys. Conf. Ser. 142 (IOP, Bristol, 1996) p. 533.
    • (1995) Inst. Phys. Conf. Ser. , vol.142 , pp. 533
    • Heera, V.1    Kögler, R.2    Skorupa, W.3    Stoemenos, J.4
  • 6
    • 1042300951 scopus 로고
    • Proc. 6th Int. Conf. on Silicon Carbide and Related Materials, Kyoto, Japan, IOP, Bristol
    • J.K.N. Lindner, K. Volz and B. Stritzker, in: Proc. 6th Int. Conf. on Silicon Carbide and Related Materials, Kyoto, Japan, (1995), Inst. Phys. Conf. Ser. 142 (IOP, Bristol, 1996) p. 145.
    • (1995) Inst. Phys. Conf. Ser. , vol.142 , pp. 145
    • Lindner, J.K.N.1    Volz, K.2    Stritzker, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.