Review of low-frequency noise in bipolar transistors over the last decade

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 2001, Pages 68-73

  Vandamme, L K J ^a   Trefan Gy ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

1 f noise; Bipolar junction transistors; Coherence method; Corner frequency; Cutoff frequency; Diodes; Empirical relation; Hetero junction bipolar transistors; Shot noise; SiGe HBTs

Indexed keywords

EQUIVALENT CIRCUITS; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DIODES; SHOT NOISE;

POLYSILICON EMITTERS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0035176373     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (40)

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