Measurement Zof low-frequency base and collector current noise and coherence in sige heterojunction bipolar transistors using transimpedance amplifiers

IEEE Transactions on Electron Devices

Volumn 46, Issue 5, 1999, Pages 993-1000

  Bruce, Staffan P O ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

HBT; Low frequency noise; Silicon germanium (sige); Transimpedance amplifiers

Indexed keywords

AMPLIFICATION; AMPLIFIERS (ELECTRONIC); ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; SEMICONDUCTING SILICON COMPOUNDS; SIGNAL NOISE MEASUREMENT;

TRANSIMPEDANCE AMPLIFIERS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0032663675     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.760408     Document Type: Article

References (9)

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