Manufacturer variability of enhanced low dose rate sensitivity (ELDRS) in a voltage comparator

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 167-171

  Krieg, J ^a   Tuflinger, T ^a   Pease, R ^a  

^a NAVSEA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; DATABASE SYSTEMS; DOSIMETRY; IRRADIATION; RADIATION HARDENING; SEMICONDUCTOR DEVICE TESTING; SENSITIVITY ANALYSIS;

ENHANCED LOW DOSE RATE SENSITIVITY (ELDRS);

COMPARATOR CIRCUITS;

EID: 0035173716     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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