Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1627-1632

  Krieg, J ^a  

^a NSWC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIMODAL TOTAL DOSE RESPONSE; BIPOLAR LINEAR VOLTAGE COMPARATOR; ELEVATED TEMPERATURE IRRADIATIONS;

BIPOLAR INTEGRATED CIRCUITS; BIPOLAR TRANSISTORS; DOSIMETRY; HIGH TEMPERATURE OPERATIONS; IRRADIATION; RADIATION EFFECTS; RADIATION HARDENING; SILICON WAFERS;

COMPARATOR CIRCUITS;

EID: 0033324766     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819131     Document Type: Article

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