Design of parameterizable error-propagating space compactors for response observation

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2001, Pages 48-53

  Morosov, A ^a   Chakrabarty, K ^a   Gossel M ^a   Bhattacharya, B ^a  

^a UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; EMBEDDED SYSTEMS; ERROR ANALYSIS; GRAPH THEORY; PARAMETER ESTIMATION;

CIRCUIT UNDER TEST; INTELLECTUAL PROPERTY CORES; SPACE COMPACTORS; SYSTEM-ON-A-CHIP DESIGN;

DESIGN FOR TESTABILITY;

EID: 0034994934     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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