New totally error propagating compactor for arbitrary cores with digital interfaces

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 49-56

  Goessel, M ^a   Sogomonyan, E S ^a   Morosov, A ^a  

^a UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DESIGN FOR TESTABILITY; ERROR DETECTION; INTEGRATED CIRCUITS; INTERFACES (COMPUTER); REDUNDANCY; SHIFT REGISTERS;

CIRCUIT UNDER TEST; CORE BASED DESIGN; DIGITAL INTERFACES; ERROR PROPAGATING COMPACTOR; TEST INPUT GENERATOR;

COMBINATORIAL CIRCUITS;

EID: 0032684767     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)