Optimal zero-aliasing space compaction of test responses

IEEE Transactions on Computers

Volumn 47, Issue 11, 1998, Pages 1171-1187

  Chakrabarty, Krishnendu ^a,b   Murray, Brian T ^a,c   Hayes, John P ^a,d  

^a IEEE   (United States)

^b Duke University   (United States)

^c GENERAL MOTORS CORPORATION   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Aliasing; Built in self testing; Fault coverage; Graph coloring; Multistep compaction

Indexed keywords

BUILT-IN SELF TEST; COMPUTER GRAPHICS EQUIPMENT; DESIGN; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; OPTIMIZATION;

ALIASING;

DATA COMPRESSION;

EID: 0032206192     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.736427     Document Type: Article

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