Mapping of the lateral polar orientational distribution in second-order nonlinear thin films by scanning second-harmonic microscopy

Applied Physics Letters

Volumn 72, Issue 3, 1998, Pages 275-277

  Vydra, Jan ^a   Eich, Manfred ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS; LASER BEAM EFFECTS; NONDESTRUCTIVE EXAMINATION; OPTICAL FILMS; SCANNING ELECTRON MICROSCOPY; SECOND HARMONIC GENERATION; THIN FILMS;

HIGH NUMERICAL APERTURE MICROSCOPE; LATERAL POLAR ORIENTATIONAL DISTRIBUTION; SCANNING SECOND HARMONIC MICROSCOPY;

NONLINEAR OPTICS;

EID: 0031647495     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120711     Document Type: Article

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