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Applied Surface Science

Volumn 172, Issue 3-4, 2001, Pages 301-306

Simulated nc-AFM images of Si(0 0 1) surface with nanotube tip

(3) Tagami, Katsunori a Sasaki, Naruo a Tsukada, Masaru a

a UNIVERSITY OF TOKYO (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; MATHEMATICAL MODELS; NANOTUBES;

TIGHT BINDING MODEL;

SILICON;

EID: 0034818289 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(00)00868-0 Document Type: Article

Times cited : (22)

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