Fourier expansion method for noncontact atomic force microscopy image simulations - application to Si(111) √3 × √3-Ag surface

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 39, Issue 2 B, 2000, Pages

  Sasaki, Naruo ^a   Aizawa, Hideaki ^a   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMS; COMPUTER SIMULATION; ELECTRONIC STRUCTURE; FOURIER TRANSFORMS; INTEGRAL EQUATIONS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING SILICON;

DENSITY FUNCTIONAL THEORY; FREQUENCY SHIFT; HONEYCOMB CHAINED TRIMER; LOCAL DENSITY APPROXIMATION; NONCONTACT ATOMIC FORCE MICROSCOPY; TIP SURFACE INTERACTION;

ATOMIC FORCE MICROSCOPY;

EID: 0033903828     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.39.L174     Document Type: Article

References (12)