Noise margins of threshold logic gates containing resonant tunneling diodes

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 47, Issue 10, 2000, Pages 1080-1085

  Bhattacharya, M ^a   Mazumder, P ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIGITAL CIRCUITS; DIGITAL SIGNAL PROCESSING; ELECTRON TUNNELING; HETEROJUNCTION BIPOLAR TRANSISTORS; LOGIC DESIGN; MOSFET DEVICES; SEMICONDUCTOR DIODES; SWITCHING NETWORKS; THRESHOLD LOGIC;

DIGITAL LOGIC CIRCUITS; NOISE MARGIN; RESONANT TUNNELING DIODES; THRESHOLD LOGIC GATES;

LOGIC CIRCUITS;

EID: 0034292691     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.877149     Document Type: Article

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