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Volumn 31, Issue 8, 1996, Pages 1151-1155

Compact multiple-valued multiplexers using negative differential resistance devices

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; GATES (TRANSISTOR); HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUIT LAYOUT; NEGATIVE RESISTANCE; QUANTUM ELECTRONICS; SEMICONDUCTOR DIODES;

EID: 0030211846     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.508262     Document Type: Article
Times cited : (48)

References (13)
  • 2
    • 0016072199 scopus 로고
    • Resonant tunneling in semiconductor double barriers
    • L. L. Chang, L. Esaki, and R. Tsu, "Resonant tunneling in semiconductor double barriers," Appl. Physics Lett., vol. 24, pp. 593-595, 1974.
    • (1974) Appl. Physics Lett. , vol.24 , pp. 593-595
    • Chang, L.L.1    Esaki, L.2    Tsu, R.3
  • 3
    • 0024137473 scopus 로고
    • Two decades of multiple-valued logic - An invited tutorial
    • S. L. Hurst, "Two decades of multiple-valued logic - An invited tutorial," in Proc. 20th Int. Symp. Multiple-Valued Logic, 1988, pp. 164-175.
    • (1988) Proc. 20th Int. Symp. Multiple-Valued Logic , pp. 164-175
    • Hurst, S.L.1
  • 4
    • 0023385890 scopus 로고
    • Resonant tunneling devices with multiple negative differential resistance and demonstration of a three-state memory cell for multiple-valued logic applications
    • July
    • F. Capasso, S. Sen, A. Y. Cho, and D. Sivco, "Resonant tunneling devices with multiple negative differential resistance and demonstration of a three-state memory cell for multiple-valued logic applications," IEEE Electron Device Lett., vol. EDL-8, July 1987.
    • (1987) IEEE Electron Device Lett. , vol.EDL-8
    • Capasso, F.1    Sen, S.2    Cho, A.Y.3    Sivco, D.4
  • 6
    • 0026820499 scopus 로고
    • Multivalued SRAM cell using resonant tunneling diodes
    • Feb.
    • S.-J. Wei and H. C. Lin, "Multivalued SRAM cell using resonant tunneling diodes," IEEE J. Solid-State Circuits, vol. 27, pp. 212-216, Feb. 1992.
    • (1992) IEEE J. Solid-State Circuits , vol.27 , pp. 212-216
    • Wei, S.-J.1    Lin, H.C.2
  • 11
    • 0028377938 scopus 로고
    • InGaAs/AlAs/InGaAsP resonant tunneling hot electron transistors grown by chemical beam epitaxy
    • Feb.
    • W. L. Chen, G. O. Munns, J. R. East, and G. I. Haddad, "InGaAs/AlAs/InGaAsP resonant tunneling hot electron transistors grown by chemical beam epitaxy," IEEE Trans. Electronic Devices, vol. 41, no. 2, pp. 155-161, Feb. 1994.
    • (1994) IEEE Trans. Electronic Devices , vol.41 , Issue.2 , pp. 155-161
    • Chen, W.L.1    Munns, G.O.2    East, J.R.3    Haddad, G.I.4
  • 13
    • 1542528409 scopus 로고
    • Picosecond switching-time measurement of a resonant-tunneling diode
    • Aug.
    • J. F. Whitaker, G. A. Mourou, T. C. L. G. Sollner, and W. D. Goodhue, "Picosecond switching-time measurement of a resonant-tunneling diode," Appl. Physics Lett., vol. 53, pp. 385-387, Aug. 1988.
    • (1988) Appl. Physics Lett. , vol.53 , pp. 385-387
    • Whitaker, J.F.1    Mourou, G.A.2    Sollner, T.C.L.G.3    Goodhue, W.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.