SCOPUS 정보 검색 플랫폼

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 3, 2000, Pages 1134-1137

Optical active gallium arsenide cantilever probes for combined scanning near-field optical microscopy and scanning force microscopy

(3) Heisig, S a Rudow, O a Oesterschulze, E a

a UNIVERSITY OF KASSEL (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL ORIENTATION; ETCHING; LIGHT EMISSION; MASKS; OPTICAL MICROSCOPY; PHOTORESISTS; SEMICONDUCTOR DOPING; SEMICONDUCTOR LASERS; SUBSTRATES; THRESHOLD VOLTAGE;

CANTILEVER PROBES; SCANNING FORCE MICROSCOPY (SFM); SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM); VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0034187466 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.591348 Document Type: Article

Times cited : (13)

References (13)

1
- 0032033560
- E. Oesterschulze, O. Rudow, C. Mihalcea, W. Scholz, and S. Werner, Ultramicroscopy 71, 85 (1998).
- (1998) Ultramicroscopy , vol.71 , pp. 85
- Oesterschulze, E.¹ Rudow, O.² Mihalcea, C.³ Scholz, W.⁴ Werner, S.⁵

2
- 0000446983
- S. Werner, O. Rudow, C. Mihalcea, and E. Oesterschulze, Appl. Phys. A: Mater. Sci. Process. 66, 367 (1998).
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66 , pp. 367
- Werner, S.¹ Rudow, O.² Mihalcea, C.³ Oesterschulze, E.⁴

3
- 0013630778
- O. Rudow, C. Mihalcea, A. Vollkopf, M. Stopka, and E. Oesterschulze, Proc. SPIE 3467, 99 (1998).
- (1998) Proc. SPIE , vol.3467 , pp. 99
- Rudow, O.¹ Mihalcea, C.² Vollkopf, A.³ Stopka, M.⁴ Oesterschulze, E.⁵

4
- 0032990824
- A. Vollkopf, O. Rudow, T. Leinhos, C. Mihalcea, and E. Oesterschulze, J. Microsc. 194, 344 (1999).
- (1999) J. Microsc. , vol.194 , pp. 344
- Vollkopf, A.¹ Rudow, O.² Leinhos, T.³ Mihalcea, C.⁴ Oesterschulze, E.⁵

5
- 0032033813
- M. Abraham, W. Ehrfeld, M. Lacher, K. Mayr, W. Noell, P. Güthner, and J. Barenz, Ultramicroscopy 71, 93 (1998).
- (1998) Ultramicroscopy , vol.71 , pp. 93
- Abraham, M.¹ Ehrfeld, W.² Lacher, M.³ Mayr, K.⁴ Noell, W.⁵ Güthner, P.⁶ Barenz, J.⁷

6
- 0029734819
- S. Akamine, H. Kuwano, and H. Yamada, Appl. Phys. Lett. 68, 579 (1996).
- (1996) Appl. Phys. Lett. , vol.68 , pp. 579
- Akamine, S.¹ Kuwano, H.² Yamada, H.³

7
- 0029553785
- H. U. Danzebrink, O. Ohlsson, and G. Wilkening, Ultramicrosc. 61, 131 (1995).
- (1995) Ultramicrosc. , vol.61 , pp. 131
- Danzebrink, H.U.¹ Ohlsson, O.² Wilkening, G.³

8
- 67649972063
- T. Leinhos, M. Stopka, and E. Oesterschulze, Appl. Phys. A: Mater. Sci. Process. 66, 65 (1998).
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66 , pp. 65
- Leinhos, T.¹ Stopka, M.² Oesterschulze, E.³

9
- 0342395596
- E. Oesterschulze, Opt. Mem. Neural Netw. 7, 251 (1998).
- (1998) Opt. Mem. Neural Netw. , vol.7 , pp. 251
- Oesterschulze, E.¹

10
- 0037879043
- edited by S. Jutamulia and T. Asakura SPIE, Bellingham, WA
- S. Heisig, W. Steffens, and E. Oesterschulze, in Far- and Near-Field Optics: Physics and Information Processing, edited by S. Jutamulia and T. Asakura (SPIE, Bellingham, WA, 1998), Vol. 3467, pp. 305-312.
- (1998) Far- and Near-Field Optics: Physics and Information Processing , vol.3467 , pp. 305-312
- Heisig, S.¹ Steffens, W.² Oesterschulze, E.³

11
- 0343700809
- Ph.D. thesis, Technische Universität München
- M. Hauser, Ph.D. thesis, Technische Universität München (1997).
- (1997)
- Hauser, M.¹

12
- 0032033799
- S. Heisig, H.-U. Danzebrink, A. Leyk, W. Mertin, S. Münster, and E. Oesterschulze, Ultramicroscopy 71, 99 (1998).
- (1998) Ultramicroscopy , vol.71 , pp. 99
- Heisig, S.¹ Danzebrink, H.-U.² Leyk, A.³ Mertin, W.⁴ Münster, S.⁵ Oesterschulze, E.⁶

13
- 0000475979
- S. Heisig and E. Oesterschulze, Appl. Phys. A: Mater. Sci. Process. 66, S385 (1998).
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66
- Heisig, S.¹ Oesterschulze, E.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.