|
|
Volumn 66, Issue SUPPL. 1, 1998, Pages
|
|
Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopy
a
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
CANTILEVER BASED SENSORS;
CANTILEVER PROBE;
FAR FIELD;
GARNET FILMS;
HIGH-LATERAL RESOLUTION;
MAGNETO-OPTICAL MEASUREMENTS;
METAL TIP;
MICROSTRUCTURE TECHNOLOGY;
NEAR FIELD OPTICAL MICROSCOPY;
NEAR FIELDS;
OPENING ANGLE;
OPTICAL APERTURE;
OPTICAL TRANSMISSIONS;
POLARIZATION PROPERTIES;
QUARTER-WAVELENGTH;
SCANNING FORCE MICROSCOPY;
SCANNING NEAR-FIELD OPTICAL MICROSCOPY;
SILICON CANTILEVER;
SIMULTANEOUS MEASUREMENT;
SUB-WAVELENGTH;
ATOMIC FORCE MICROSCOPY;
LIGHT;
LIGHT SOURCES;
LIGHT TRANSMISSION;
MECHANICAL PROPERTIES;
NANOCANTILEVERS;
OPTICAL DATA PROCESSING;
OPTICAL DATA STORAGE;
OPTICAL INSTRUMENTS;
OPTICAL PROPERTIES;
POLARIZATION;
PROBES;
SCANNING;
SCANNING TUNNELING MICROSCOPY;
SILICATE MINERALS;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
|
|
EID: 0000446983
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051165 Document Type: Article |
|
Times cited : (47)
|
|
References (14)
|
