Cantilever probes for SNOM applications with single and double aperture tips

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 85-92

  Oesterschulze, E ^a   Rudow, O ^a   Mihalcea, C ^a   Scholz, W ^a   Werner, S ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

Atomic force microscopy; Near field scanning optical microscopy; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; LIGHT TRANSMISSION; MECHANICAL PROPERTIES; MICROSTRUCTURE; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; POLARIZATION; TECHNOLOGY;

APERTURE TIPS; CANTILEVER BASED PROBE CONCEPT; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SCANNING PROBE MICROSCOPY;

OPTICAL FIBERS;

ARTICLE; MEASUREMENT; POLARIZATION; SCANNING FORCE MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SENSOR;

EID: 0032033560     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00089-2     Document Type: Article

References (17)

1. Pohl, Denk W., Lanz M. Appl. Phys. Lett. 44:1984;651-653.
2. Dürig, Pohl D.W., Rohner F. J. Appl. Phys. 59:1986;3318-3327.
3. Fischer, Dürig U.T., Pohl D.W. Appl. Phys. Lett. 52:1988;249-251.
4. Betzig, Lewis A., Isaacson M. Biophys. Soc. 49:1986;269-279.
5. Betzig, Trautman J.K. Appl. Opt. 31:1992;4563-4568.
6. Froehlich, Milster T.D. Appl. Opt. 34(31):1995;7273-7279.
7. van Hulst, Moers M.H.P., Noordman O.F.J., Faulkner T., Segerink F.B., van der Werf K.O., de Grooth B.G., Bölger B. SPIE. 1639:1992;36-43.
8. van Hulst, Moers M.H.P., Noordman O.F.J., Tack R.G., Segerink F.B. Appl. Phys. Lett. 62:1993;461-463.
9. Radmacher, Hillner P.E., Hansma P.K. Rev. Sci. Instr. 65:1994;1625-1632.
10. Zenhausern, O'Boyle M.P., Wickramasinghe K.H. Appl. Phys. Lett. 65:1994;1623-1625.
11. Danzebrink, Ohlsson O., Wilkening G. Ultramicroscopy. 61:1995;131-138.
12. Akamine, Kuwano H., Yamada H. Appl. Phys. Lett. 68(5):1994;579-581.
13. Mihalcea, Scholz W., Werner S., Münster S., Oesterschulze E., Kassing R. Appl. Phys. Lett. 68(25):1996;3531-3533.
14. Werner, S. Münster, S. Heisig, C. Mihalcea, W. Scholz, E. Oesterschulze, presented at SPIE Optoelectronics 97, 1997.
15. Münster, S. Werner, C. Mihalcea, W. Scholz, E. Oesterschulze, J. Microscopy, 1996, accepted for publication.
16. Stopka, Hadjiiski L., Oesterschulze E., Kassing R. J. Vac. Sci. Technol. B. 13:1995;2153-2156.
17. Novotny A., Pohl D.W., Hecht B. Ultramicroscopy. 61:1995;1-9.