Testing content-addressable memories using functional fault models and march-like algorithms

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 5, 2000, Pages 577-588

  Lin Kun Jin, ^a   Wu Cheng Wen, ^b  

^a WINBOND ELECTRONICS CORPORATION   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS; MATHEMATICAL MODELS; SEMICONDUCTOR STORAGE;

CONTENT ADDRESSABLE MEMORY; FAULT MODELLING; FUNCTIONAL TESTING; LOGIC CIRCUIT TESTING; STUCK OPEN FAULTS;

ASSOCIATIVE STORAGE;

EID: 0033727066     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.845082     Document Type: Article

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