Methodologies for Testing Embedded Content Addressable Memories

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 7, Issue 1, 1988, Pages 11-20

  Mazumder, Pinaki ^a   Patel, Janak H ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - ALGORITHMS; FAILURE ANALYSIS - COMPUTER APPLICATIONS;

COMMON FUNCTION FAULTS; EMBEDDED CONTENT ADDRESSABLE MEMORIES; PATTERN-SENSITIVE FAULTS; STUCK-AT AND ADJACENT-CELL COUPLING FAULTS;

DATA STORAGE, DIGITAL;

EID: 0023871372     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.3126     Document Type: Article

References (15)

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