DESIGN AND ALGORITHMS FOR PARALLEL TESTING OF RANDOM ACCESS AND CONTENT ADDRESSABLE MEMORIES.

Proceedings - Design Automation Conference

Volumn , Issue , 1987, Pages 688-694

  Mazumder, P ^a   Patel, J H ^a   Fuchs, W K ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER AIDED DESIGN; COMPUTER PROGRAMMING - ALGORITHMS;

COMPUTER ADDRESSABLE MEMORY; DESIGN-FOR-TESTABILITY; PARALLEL TESTING; PATTERN-SENSITIVE FAULTS; RANDOM ACCESS MEMORY;

DATA STORAGE, DIGITAL;

EID: 0023171952     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/37888.37999     Document Type: Conference Paper

References (14)