Fault modeling and testing of content-addressable memories

Volumn , Issue , 1994, Pages 78-83

  Al Assadi, W K ^a   Jayasumana, A P ^a   Malaiya, Y K ^a  

^a Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER ARCHITECTURE; DEFECTS; MANAGEMENT INFORMATION SYSTEMS; NEURAL NETWORKS; PARALLEL PROCESSING SYSTEMS; PATTERN RECOGNITION; RANDOM ACCESS STORAGE; SHIFT REGISTERS; TRANSISTORS;

CONTENT ADDRESSABLE MEMORIES; DATA INTERROGATION; INDUCTIVE FAULT ANALYSIS; RESPONSE FLAG REGISTER; STATIC RANDOM ACCESS MEMORIES;

SEMICONDUCTOR STORAGE;

EID: 0028599740     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)