Functional testing of content-addressable memories

Proceedings - International Workshop on Memory Technology, Design and Testing, MTDT 1998

Volumn 1998-August, Issue , 1998, Pages 70-75

  Lin, Kun Jin ^a   Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMS; TESTING;

APPLICATION SPECIFIC; FAULT MODEL; FUNCTIONAL TEST; FUNCTIONAL TESTING; PHYSICAL DEFECTS; SINGLE-BIT; TEST LENGTHS;

ASSOCIATIVE STORAGE;

EID: 85013949460     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.1998.705950     Document Type: Conference Paper

References (9)

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