Using March Tests to Test SRAMs

IEEE Design and Test of Computers

Volumn 10, Issue 1, 1993, Pages 8-14

  Van De Goor, Ad J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE TESTING;

FAULT MODELS; MEMORY CHIPS; MEMORY TESTING; SRAM TESTING;

RANDOM ACCESS STORAGE;

EID: 0027553221     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.199799     Document Type: Article

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