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Volumn 75, Issue 22, 1999, Pages 3569-3571
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Energy dissipation in tapping-mode scanning force microscopy with low quality factors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000102942
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.125391 Document Type: Article |
Times cited : (59)
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References (19)
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