Imaging the elastic nanostructure of ge islands by ultrasonic force microscopy

Physical Review Letters

Volumn 81, Issue 5, 1998, Pages 1046-1049

  Kolosov, Oleg V ^a   Castell, Martin R ^a   Marsh, Chris D ^a   Briggs, G Andrew D ^a   Kamins, T I ^b   Stanley Williams, R ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001162851     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.1046     Document Type: Article

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