Point defects and their diffusion in mercury cadmium telluride: Investigation based upon high-resolution X-ray diffraction

Diffusion and Defect Data. Pt A Defect and Diffusion Forum

Volumn 183, Issue , 2000, Pages 103-126

  Mainzer, N ^a,b   Zolotoyabko, E ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b SCD Semiconductor Devices Ltd   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DIFFUSION IN SOLIDS; ION IMPLANTATION; MERCURY COMPOUNDS; PERCOLATION (SOLID STATE); POINT DEFECTS; X RAY CRYSTALLOGRAPHY;

DEFECT MIGRATION; HIGH RESOLUTION X RAY DIFFRACTION (HRXRD); IMPLANTATION DAMAGE;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0033701653     PISSN: 10120386     EISSN: None     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.183-185.103     Document Type: Article

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