Reciprocal space mapping

Critical Reviews in Solid State and Materials Sciences

Volumn 22, Issue 2, 1997, Pages 69-110

  Fewster, Paul F ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Reciprocal space mapping; X ray diffraction techniques; X ray scattering methods

Indexed keywords

DIFFRACTOMETERS; LATTICE CONSTANTS; REFLECTOMETERS; RELAXATION PROCESSES; SEMICONDUCTOR MATERIALS; THREE DIMENSIONAL; X RAY DIFFRACTION; X RAY SCATTERING;

LATTICE RELAXATIONS; RECIPROCAL SPACE MAPPING; SINGLE SCAN X RAY SCATTERING;

MATHEMATICAL TECHNIQUES;

EID: 0031327113     PISSN: 10408436     EISSN: None     Source Type: Journal    
DOI: 10.1080/10408439708241259     Document Type: Article

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