X-ray diffraction in quantum-well structures

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 487-493

  Zolotoyabko, E ^a   Finkelstein, Y ^a   Blumina, M ^a   Fekete, D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR GROWTH; STATISTICAL METHODS; SUBSTRATES; SURFACE ROUGHNESS; X RAY DIFFRACTION;

DECAYING AMPLITUDE; ROCKING CURVES; SCATTERING AMPLITUDES; TRIPLE LAYERED QUANTUM WELL STRUCTURES;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0030562978     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00969-8     Document Type: Article

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