Influence of structural defects on lattice parameter and measured composition of Hg1-xCdxTe epilayers

Journal of Crystal Growth

Volumn 197, Issue 3, 1999, Pages 542-546

  Mainzer, N ^a,b   Zolotoyabko, E ^a   Berner, A ^a   Lakin, E ^a   Bahir, G ^a   Sher, A ^c  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b SCD Semiconductor Devices Ltd   (Israel)

^c SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

Defects; HgCdTe; X ray diffraction

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; ENERGY DISPERSIVE SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LATTICE CONSTANTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR GROWTH; SUBSTRATES; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

BOND METHOD; HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY; HIGH RESOLUTION X RAY DIFFRACTION;

SEMICONDUCTING FILMS;

EID: 0033514141     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00748-9     Document Type: Article

References (17)

1. M. Lyakas, D. Parnis, W.D. Kaplan, E. Zolotoyabko, M. Eizenberg, V. Demuth, H.P. Strunk, Appl. Phys. Lett. 70 (1997) 1287.
2. S. Bernardi, P. Franzosi, in: P. Capper (Ed.), Properties of Narrow-Gap Cadmium-Based Compounds, IMSPEC, the Institute of Electrical Engineers, London, 1994, p. A5.11.
3. N. Mainzer, D. Shilo, E. Zolotoyabko, G. Bahir, A. Sher, K. Cyterman, R. Brener, J. Appl. Phys. 82 (1997) 2869.
4. N. Mainzer, D. Shilo, E. Zolotoyabko, G. Bahir, A. Sher, J. Electron. Mater. 26 (1997) 606.
5. B.L. Williams, H.G. Robinson, C.R. Helms, N. Zhu, J. Electron. Mater. 26 (1997) 600.
6. T. Skauli, T. Colin, S. Lovold, J. Crystal Growth 172 (1997) 97.
7. W.L. Bond, Acta Crystallogr. 13 (1960) 814.
8. G. Cinader, A. Raizman, A. Sher, J. Vac. Sci. Technol. B 9 (1991) 1634.
9. K. Ghandi, K.K. Parat, H. Ehsani, I. Bhat, Appl. Phys. Lett. 58 (1991) 828.
10. P. Capper, in: P. Capper (Ed.), Properties of Narrow-Gap Cadmium-Based Compounds, IMSPEC, the Institute of Electrical Engineers, London, 1994, p. A2.2.
11. S.B. Reed, Electron Microprobe Analysis, Cambridge University Press, Cambridge, 1975.
12. V. Ariel, V. Garber, D. Rosenfeld, G. Bahir, Appl. Phys. Lett. 66 (1995) 2101.
13. G.R. Woolhouse, T.J. Magee, H.A. Kawayoshi, C.S.H. Leung, R.D. Ormond, J. Vac. Sci. Technol. A 3 (1985) 83.
14. D.T. Cheung, J. Vac. Sci. Technol. A 3 (1985) 128.
15. P. Capper, C.D. Maxey, P.A.C. Wiffin, B.C. Easton, J. Crystal Growth 96 (1989) 519.
16. H.F. Schaake, J.H. Tregilgas, J. Vac. Sci. Technol. A 4 (1986) 2181.
17. S. Cole, G.P. Carey, J.A. Silberman, W.E. Spicer, J.A. Wilson, J. Vac. Sci. Technol. A 3 (1985) 206.