Characterization of CdTe/Hg1-xCdx heterostructures by high-resolution x-ray diffraction

Journal of Electronic Materials

Volumn 26, Issue 6, 1997, Pages 606-609

  Mainzer, N ^a,b   Shilo, D ^a   Zolotoyabko, E ^a   Bahir, G ^a   Sher, A ^c  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b SCD Semiconductor Devices Ltd   (Israel)

^c SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

CdTe Hg1 xCdxTe; Heterostructure; Implantation; X ray diffraction

Indexed keywords

EID: 0342891328     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0202-9     Document Type: Article

References (10)

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