Extended Kinematic Approach to the Simulation of High-Resolution X-ray Diffraction Spectra. Application to Structures with Buried Amorphous Layers

Journal of Applied Crystallography

Volumn 31, Issue 2, 1998, Pages 241-251

  Zolotoyabko, Emil ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001271976     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897009096     Document Type: Article

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