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Volumn 398, Issue 1-2, 1998, Pages 60-69

The role of Si atoms in In/Si (111) surface phase formation

Author keywords

Atom solid interactions; Auger electron spectroscopy; Indium; Low energy electron diffraction; Scanning tunneling microscopy; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; DEPOSITION; ELECTRON TRANSITIONS; INDIUM; LOW ENERGY ELECTRON DIFFRACTION; MASS TRANSFER; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; SUBSTRATES; SURFACE ROUGHNESS;

EID: 0031998595     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)80011-3     Document Type: Article
Times cited : (17)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.