Si(111)2 × 2-In ↔ Si(111)√3 × √3-In scanning tunneling microscope tip-induced structural transformation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 6 SUPPL. B, 1997, Pages 3814-3817

  Saranin, Alexander A ^a,b   Numata, Toshinori ^a   Kubo, Osamu ^a   Tani, Hitoshi ^a   Katayama, Mitsuhiro ^a   Oura, Kenjiro ^a  

^a OSAKA UNIVERSITY   (Japan)

^b Inst Automat and Contr Processes   (Russian Federation)

Author keywords

Atom manipulation; Field induced diffusion; Scanning tunneling microscope; Si(111)2 2 in; Si(111) 3 3 in; Silicon

Indexed keywords

EID: 0344159815     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3814     Document Type: Article

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