Structural transformations at room temperature adsorption of In on Si(111)√3 × √-In surface: LEED-AES-STM study

Surface Science

Volumn 388, Issue 1-3, 1997, Pages 299-307

  Saranin, A A ^a,b,c   Zotov, A V ^a,b,d   Numata, T ^a   Kubo, O ^a   Ignatovich, K V ^b   Lifshits, V G ^b,c,d   Katayama, M ^a   Oura, K ^a  

^a OSAKA UNIVERSITY   (Japan)

^b INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^c FAR EASTERN FEDERAL UNIVERSITY   (Russian Federation)

^d VLADIVOSTOK STATE UNIVERSITY OF ECONOMICS AND SERVICE   (Russian Federation)

Author keywords

Atom solid interactions; Auger electron spectroscopy (AES); Indium; Low energy electron diffraction (LEED); Scanning tunnelling microscopy (STM); Silicon; Surface structure, morphology, roughness and topography

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; DEPOSITION; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS;

ATOM SOLID INTERACTIONS; SURFACE TOPOGRAPHY; TRIMERS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0041161079     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00414-7     Document Type: Article

References (21)

1. V.G. Lifshits, A.A. Saranin, A.V. Zotov, Surface Phases on Silicon, Wiley, Chichester, UK, 1994, p. 450.
2. D. Bolmont, P. Chen, C.A. Sebenne, F. Proix, Surf. Sci. 137 (1984) 280.
3. M.K. Kelly, G. Margaritondo, J.A. Anderson, D.J. Frankel, G.J. Lapeyre, J. Vac. Sci. Technol. A4 (1986) 1396.
4. P. Chen, D. Bolmont, C.A. Sebenne, J. Phys. C 17 (1984) 4897.
5. S. Baba, Z.J. Ming, A. Kinbara, Jpn. J. Appl. Phys. 19 (1980) 1571.
6. S. Hasegawa, S. Ino, Int. J. Mod. Phys. B7 (1993) 3817.
7. N. Shimomura, T. Yamanaka, S. Ino, Jpn. J. Appl. Phys. 34 (1995) 6201.
8. T. Yamanaka, N. Shimomura, S. Ino, Surf. Sci. 356 (1996) 39.
9. A.A. Saranin, T. Numata, O. Kubo, H. Tani, M. Katayama, K. Oura, Jpn. J. Appl. Phys., in press.
10. J.J. Lander, J. Morrison, Surf. Sci. 2 (1964) 553.
11. D. Briggs, M.P. Seach, in D. Briggs, M.P. Seach (Eds.), Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, Chichester, UK, 1983, chap. 5, pp. 203-243.
12. S. Tanuma, C.J. Powell, D.R. Penn, Surf. Interface Anal. 17 (1991) 911.
13. J. Nogami, S. Park, C.F. Quate, Phys. Rev. B 36 (1987) 6221.
14. J. Kraft, S.L. Surnev, F.P. Netzer, Surf. Sci. 340 (1995) 36.
15. H. Hirayama, S. Baba, A. Kinbara, Appl. Surf. Sci. 33/34 (1988) 193.
16. A.A. Saranin, T. Numata, O. Kubo, M. Katayama, K. Oura, Appl. Surf. Sci., in press.
17. J. Nogami, S. Park, C.F. Quate, J. Vac. Sci. Technol. B6 (1988) 1479.
18. F. Owman, P. Mårtensson, Surf. Sci. 359 (1996) 122.
19. S. Park, J. Nogami, C.F. Quate, J. Microscopy 152 (1988) 727.
20. S.L. Surnev, J. Kraft, F.P. Netzer, J. Vac. Sci. Technol. A13 (1995) 1389.
21. J. Kraft, F.P. Netzer, Surf. Sci. 357/358 (1996) 740.