Superconducting material diagnostics using a scanning near-field microwave microscope

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 4127-4132

  Anlage, Steven M ^a   Steinhauer, D E ^a   Vlahacos, C P ^a   Feenstra, B J ^a   Thanawalla, A S ^a   Hu, Wensheng ^a   Dutta, Sudeep K ^a   Wellstood, F C ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; MICROSCOPIC EXAMINATION; MICROWAVE DEVICES; SURFACE TOPOGRAPHY; YTTRIUM COMPOUNDS;

ELECTRODYNAMIC PROPERTIES; SCANNING NEAR FIELD MICROWAVE MICROSCOPE; SHEET RESISTANCE; YTTRIUM BARIUM CUPRATES;

SUPERCONDUCTING MATERIALS;

EID: 0032682815     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783934     Document Type: Article

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