Near-field scanning microwave microscopy: Measuring local microwave properties and electric field distributions

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 1998, Pages 965-968

  Feenstra, B J ^a   Vlahacos, C P ^a   Thanawalla, Ashfaq S ^a   Steinhauer, D E ^a   Dutta, S K ^a   Wellstood, F C ^a   Anlage, Steven M ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC FREQUENCY CONTROL;

NEAR-FIELD SCANNING MICROWAVE MICROSCOPY;

MICROWAVE DEVICES;

EID: 0031628691     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)