Scanning microwave microscopy of active superconducting microwave devices

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 3, 1997, Pages 3686-3689

  Anlage, Steven M ^a   Vlahacos, C P ^a   Dutta, Sudeep ^a   Wellstood, F C ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COAXIAL CABLES; DEMODULATORS; IMAGING SYSTEMS; LIGHT REFLECTION; MICROWAVE DEVICES; OPTICAL RESOLVING POWER; SCANNING; SUPERCONDUCTING CABLES;

SCANNING MICROWAVE MICROSCOPY; SPATIAL RESOLUTION; SUPERCONDUCTING MICROWAVE DEVICES; VECTOR DEMODULATION CIRCUIT;

MICROSCOPES;

EID: 0031169782     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.622218     Document Type: Article

References (7)

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4. T. Wei X. D. Xiang W. G. Wallace-Freedman and P. G. Schultz Scanning Tip Microwave Near-Field Microscope Appl. Phys. Lett. vol. 68 pp. 3506-3508 (1996).
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6. C. P. Vlahacos R. C. Black S. M. Anlage A. Amar and F. C. Wellstood Near-Field Scanning Microwave Microscope with 100 (Am Resolution Appl. Phys. Lett (in press 1996).
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