Scanning electromagnetic transmission line microscope with sub-wavelength resolution

Optics Communications

Volumn 69, Issue 3-4, 1989, Pages 219-224

  Fee, M ^a   Chu, Steven ^a   Hansch T W ^b,c  

^a STANFORD UNIVERSITY   (United States)

^b MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^c UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; OPTICAL COMMUNICATION; TELECOMMUNICATION LINES, STRIP; WAVEGUIDE COMPONENTS--COUPLERS;

MICROLITHOGRAPHY; SCANNING OPTICAL NEAR FIELD MICROSCOPES;

MICROSCOPES;

EID: 0024303967     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(89)90103-X     Document Type: Article

References (15)

1. Near-field optical-scanning microscopy