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Review of Scientific Instruments
Volumn 65, Issue 6, 1994, Pages 2082-2090
A broadband method for the measurement of the surface impedance of thin films at microwave frequencies
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[No Author keywords available]
Indexed keywords

EID: 0345474040     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1144816     Document Type: Article
Times cited : (118)
References (33)
  • 23
    • 84951346453 scopus 로고    scopus 로고
    • The microwave connector used is a V101-F connector, made by Wiltron Corp
  • 24
    • 84951346129 scopus 로고    scopus 로고
    • The coaxial cable used is ISOCORE semi-rigid coaxial cable, manufactured by Rogers Corp., part number IA-086NS
  • 25
    • 84951346127 scopus 로고    scopus 로고
    • The scale factor Γ may be obtained from the following considerations. Assume that we have an ideal, lossless coaxial transmission line of inner radius a and outer radius b. For a given (instantaneous) current I flowing through the transmission line, the (instantaneous) magnetic field at a distance r from the transmission line axis is given by [formula omitted] Similarly, the (instantaneous) electric field generated by an (instantaneous) potential difference V between the inner and outer conductors is given by [formula omitted] The ratio [formula omitted] in terms of [formula omitted] and [formula omitted] is given by [formula omitted] This gives the relationship between the field impedance [formula omitted] and the “ohmic’ impedance [formula omitted] for the TEM mode in the coaxial system, and yields [formula omitted]
  • 29
    • 84951346128 scopus 로고
    • See, for example, Hewlett Packard Application Note 183, p.
    • (1978) , vol.39
  • 30
    • 84951346125 scopus 로고    scopus 로고
    • It should be noted that only the termination connector and a one meter long section of the coaxial cable are cold during the measurement. The remaining connectors in the system all remain at room temperature. In addition, although the error coefficients depend strongly on frequency, we expect them to be only very weakly dependent, if at all, on the temperature, external magnetic field, dc bias current and rf power, at least over the range of the measurements presented here
  • 31
    • 84951346126 scopus 로고    scopus 로고
    • The analysis involving TEM waves is actually not appropriate when considering the substrate in the measurement configuration used here because such an analysis assumes the same transverse field variations in the substrate as in the coaxial cable. This is clearly not the case, owing to the different geometries for the substrate and coaxial cable. A more complete calculation must take into account non-TEM propagation in the substrate and coaxial cable, along the lines of Ref. 18. The TEM calculations do, however, give a good indication of the effect of the substrate on our measurement

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.