An in-situ hot stage for temperature-dependent tapping-mode™ atomic force microscopy

Review of Scientific Instruments

Volumn 69, Issue 9, 1998, Pages 3245-3250

  Prilliman, S G ^a   Kavanagh, A M ^a   Scher, E C ^a   Robertson, S T ^a   Hwang, K S ^a   Colvin, V L ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; CALIBRATION; CONDUCTIVE FILMS; HEATING EQUIPMENT; HIGH TEMPERATURE PROPERTIES; INFRARED IMAGING; MORPHOLOGY; NATURAL FREQUENCIES; POLYMERS; TEMPERATURE CONTROL; THERMOCOUPLES;

NANOMETER SCALE MORPHOLOGY; PARAFFIN CRYSTALS; RESISTIVE THERMAL DETECTOR; TAPPING MODE ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0032160910     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149090     Document Type: Article

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