Scanning force microscope and vacuum chamber for the study of ice films: Design and first results

Review of Scientific Instruments

Volumn 69, Issue 4, 1998, Pages 1781-1784

  Bluhm, H ^a   Pan, S H ^a   Xu, L ^a   Inoue, T ^a,b   Ogletree, D F ^a   Salmeron, M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000130390     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148841     Document Type: Article

References (15)

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