Temperature controlled microstage for an atomic force microscope

Review of Scientific Instruments

Volumn 67, Issue 7, 1996, Pages 2554-2556

  Musevic I ^a   Slak, G ^a   Blinc, R ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000944132     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147212     Document Type: Article

References (3)

1. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. T. Thundat, R. J. Warmack, G. Y. Chen, and D. P. Allison, Appl. Phys. Lett. 64, 2894 (1994).
3. M. Radmacher, J. P. Cleveland, and P. K. Hansma, Scanning 17, 117 (1995).