Radiation induced trap levels in simox oxides: Low temperature thermally stimulated luminescence

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 3, 1998, Pages 1396-1401

  Martini, M ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; IRRADIATION; LIGHT EMISSION; LUMINESCENCE; OXIDES; SILICA; X RAYS;

ELECTRON TRAPS; HOLE TRAPS; THERMALLY STIMULATED LUMINESCENCE;

RADIATION EFFECTS;

EID: 0032097192     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685213     Document Type: Article

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