Common Origin for Electron and Hole Traps in MOS Devices

IEEE Transactions on Electron Devices

Volumn 34, Issue 12, 1987, Pages 2535-2539

  Aslam, Mohammad ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342762156     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.23345     Document Type: Article

References (22)

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18. M. Aslam, to be published.
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