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Volumn 49, Issue 12, 1978, Pages 5997-6003
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Thermal reemission of trapped electrons in SiO2
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONS - EMISSION;
SILICA;
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EID: 0018151899
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.324568 Document Type: Article |
Times cited : (74)
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References (33)
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